A research team introduces a fully automated, non-destructive phenotyping platform that combines X-ray fluorescence microscopy with computer vision and machine learning.

Optical 3D metrology enables fast, non-contact surface roughness measurement of defects and roughness for precise ...

Semiconductors are used in devices such as memory chips and solar cells, and within them may exist invisible defects that ...

Recent developments in machine learning techniques have been supported by the continuous increase in availability of high-performance computational resources and data. While large volumes of data are ...