With the inventions of transmission electron microscopy (TEM) in 1931 and scanning electron microscopy (SEM) shortly after in 1937, scientists gained an unprecedented ultrastructural view of the ...
This image is a scanning electron microscope micrograph of a strongly crumpled graphene sheet on a silicon wafer. The lateral size of the image is 20 microns. The Si wafter is at the bottom right ...
In the world of nanotechnology, where structures are measured in billionths of a meter, precise imaging and measurement techniques are essential. Critical Dimension Scanning Electron Microscopy ...
A persistent problem in scanning electron microscopy is the deposition of hydrocarbon contamination induced by an electron beam. Generally, the deposition of contamination on a specimen is a negative ...
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