As the transistor geometry shrinks, more transistors are packed on to a single chip, reducing manufacturing cost on a per-transistor basis. The result, however, is more transistors to test; hence, ...
Connected devices and systems have become an integral part of our everyday life and we take this for granted. Finding the fastest way to our destination with a smartphone, reading the news on a tablet ...
More than 40 chips have been licensed to use EFLX eFPGA and >20 chips are working in silicon. Big customers like Renesas are planning high volume families of chips using embedded FPGA. As a result, we ...
Design for testability (DFT) works to make a circuit more testable to ensure that it was manufactured correctly. Alfred Crouch explains the purpose of DFT in his book, Design-For-Test for Digital ICs ...
Until very recently, semiconductor design, verification, and test were separate domains. Those domains have since begun to merge, driven by rising demand for reliability, shorter market windows, and ...
REDSTONE ARSENAL, Ala. -- The U.S. Army Aviation and Missile Research, Development and Engineering Center successfully launched three modular open systems architecture test missiles Sept. 21 at the ...
Key elements that drive a battery-cell tester. Three main architectures used to construct a tester. Battery-cell testers are commercially available at many different levels of performance. Performance ...
Toshiba Corp. has produced the first functional test chip which conforms to a new integrated-circuit architecture called X, which includes interconnects using diagonal pathways as well as the ...
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