TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (www.jeol.com) (President Gon-emon Kurihara) announces the release of a new benchtop scanning electron microscope (SEM), the JCM-7000 series NeoScope TM, ...
TOKYO — JEOL Ltd. (TOKYO:6951)(President and CEO: Izumi Oi) announces the release of the new Schottky Field Emission Scanning Electron Microscope JSM-IT810 on July 28, 2024. Field Emission Scanning ...
Nikon Instruments and JEOL have collaborated on the NeoScope, a new bench scanning electron microscope (SEM) that the companies say fill the optical microscopist's need for advanced imaging capability ...
JEOL has developed two new publications that explain the theory and operation of SEM (scanning electron microscopes) for routine imaging and elemental analysis. These two new books can be downloaded ...
JEOL introduces its latest Energy Dispersive Spectrometer (EDS), the Gather-X. This new windowless EDS answers the need for higher sensitivity and low-energy X-Ray detection in the Scanning Electron ...
July 14, 2012. JEOL at Semicon West introduced a new NeoScope scanning electron microscope (SEM), which offers higher magnification than the original NeoScope bench-top version, introduced in 2008.
JEOL is pleased to announce the introduction of a new CRYO-FIB-SEM, a Focused Ion Beam milling specimen preparation tool specifically designed for creating thin, frozen samples for Cryo-Electron ...
TOKYO — JEOL Ltd. (TOKYO:6951) (www.jeol.com) (President Gon-emon Kurihara) announces the release of a new benchtop scanning electron microscope (SEM), the JCM-7000 series NeoScope TM, to be released ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results