AZOM

Advanced SEM Sample Preparation for Traditional and Air-sensitive Materials

insights from industryBrandon Van Leer & Eric GoergenSr. Product Marketing ManagersThermo Fisher Scientific In this interview, AZoM speaks with Brandon Van Leer, Sr. Product Marketing Manager, and ...
AZOM

UHR-SEM Combined with FIB for Sample Preparation - TESCAN AMBER

TESCAN AMBER is designed with a focus on versatility, covering both sample characterization at the nanoscale, and everyday FIB applications in the materials research lab. The synergy of its field free ...
AZoNano

Sample Characterization with High Current Plasma FIB-SEM

In this interview, we speak to Martin Slama at TESCAN, who describes sample preparation using high current plasma FIB SEM. Can you describe what high current plasma FIB-SEM is? The high current plasma ...
AZoNano

ZEISS Crossbeam: FIB-SEM for High Throughput 3D Analysis and Sample Preparation

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Request A Quote Download PDF Copy Request A Quote Download ...
MD&M East

Using SEM for Medical Applications

A variety of scanning electron microscopy techniques are available to medical manufacturers to assist in analyzing and characterizing material surfaces. by John Humenansky Table I. A breakdown of the ...