EDN

Decreasing the Cost of Test with Automatic Test Pattern Generation

Success in the electronics business hinges on producing high-quality products and using the most cost-effective methods to do so. As the number of devices on integrated circuits continues to double ...
Electronic Design

What’s The Difference Between Scan ATPG And IJTAG Pattern Retargeting?

Both scan automated test pattern generation (ATPG) patterns and IJTAG patterns 1,2,3 are created for a piece of logic that is part of a much larger design. For both, the patterns are independent from ...
Design-Reuse

Faster and Fewer Patterns with Breakthrough ATPG to the Rescue

New semiconductor technologies like FinFETs are giving rise to new types of fault effects not covered by standard stuck-at and at-speed tests. Automatic test pattern generation (ATPG) tools perform ...
EDN

An intelligent scan-stitched architecture for better ATPG test efficiency

Design for Test (DFT) is a name for design techniques that add certain testability features to a microelectronic hardware product design. The premise of the added features is that they make it easier ...
Electronic Design

What's The Difference Between ATPG And Logic BIST? (.PDF download)

Two test strategies are used to test virtually all IC logic: automatic test pattern generation (ATPG) with test pattern compression and logic built-in self-test (BIST)... Register or sign in below to ...
Semiconductor Engineering

A Simple Way To Improve Automotive In-System Test

Test points for hybrid ATPG/LBIST applications make it easier to reach the ISO 26262 standard of 90% stuck-at coverage for in-system test. The remarkable growth in automotive IC design has prompted a ...
Semiconductor Engineering

Power-Aware Test Vector Porting For Production ATE

Power management in contemporary system-on-chip (SoC) designs is almost unimaginably complex. Processors and other chip cores turn on and off as needed. Advanced features such as dynamic voltage and ...