Portable 3D optical inspection with 4Di InSpec transforms surface metrology, enhancing defect detection and quality assurance ...

Optical surface defect inspection and imaging techniques are pivotal to ensuring high-performance outcomes across a myriad of applications including semiconductor manufacturing, precision optics, and ...

Topology originated from the classification of geometric structures in mathematics, and have prevailed in a variety of branches of physics, ranging from the early electronic topological insulator to ...

Defects are responsible for many well-known processes: plastic deformations and fracture in metals are governed by dislocations, vortices in the atmosphere show up as tornadoes, disclinations in ...

“Our customers' need to quickly ramp processes that use complex patterning strategies creates defect challenges that drive our ongoing innovation in both optical and electron-beam technologies,” said ...

(Nanowerk News) National University of Singapore (NUS) physicists have developed a method using a focused beam of helium ions to create arrays of defects in hexagonal boron nitride (hBN) that can ...

A research team led by Prof. Sergey Kharintsev has answered a long-standing question: why the refractive index of spatially confined media, such as quantum dots, nanocrystals and thin films, can ...

“Our customers are highly motivated to continue to extend optical inline defect inspection beyond the 20nm node,” said Keith Wells, vice president and general manager of the Wafer Inspection (WIN) ...

Based on: Vision: Its Optical Defects and the Adaptation of Spectacles. With seventy-four illustrations on wood, and selections from the test-types of Jaeger and Snellen. By C. S. Fenner, M. D. Second ...

Two-dimensional (2D) materials have emerged as a significant class of materials promising for photocatalysis, and defect ...

MILPITAS, Calif., July 8, 2019 /PRNewswire/ -- Today KLA Corporation (NASDAQ: KLAC) announced the 392x and 295x optical defect inspection systems and the eDR7380™ e-beam defect review system. The new ...