FREMONT, Calif.–Therma-Wave Inc. today announced the first critical dimension (CD) metrology tool that combines spectroscopic ellipsometry technology for high levels of optical measurement with ...

Myungkoo Kang (left), S.K. Sundaram (center), and Mehdi Kabir. Alfred University is recipient of a National Science Foundation (NSF) grant of nearly $350,000, which will be used to acquire equipment ...

Alfred University is recipient of a National Science Foundation (NSF) grant of nearly $350,000, which will be used to acquire equipment that will enhance multi-disciplinary research and education ...

Optical microscopy has long served as a fundamental tool in the visualisation of intricate structures across biological, materials and industrial research. Recent advancements in metrology techniques ...

“As smaller structures are being increasingly adopted in the semiconductor industry, the performance of memory and logic devices is being continuously improved with innovative 3D integration schemes ...

WILMINGTON, Mass.--(BUSINESS WIRE)--Onto Innovation Inc. (NYSE: ONTO) today announced that a leading DRAM manufacturer has finalized a $69 million volume purchase agreement spanning Onto Innovation’s ...

FLANDERS, N.J.--(BUSINESS WIRE)--Rudolph Technologies, Inc. (NASDAQ: RTEC), a leading provider of process characterization, photolithography equipment and software for the semiconductor, FPD, LED and ...

A transparent conductive oxide (TCO) is a material that is optically transparent and electrically conductive. It is frequently utilized as a top electrode in thin-film solar cells, flat-panel displays ...

With the aggressive scaling of the CMOS-based microelectronic circuit, device structures that obey “nano-physical” rules will be introduced in the near term, presenting new challenges to metrologists.

For the last two decades, Korea has been at the forefront of technological innovation, arguably overtaking its neighbors in developing everything from consumer electronics to automobiles and advanced ...