Defects often limit the performance of devices such as light-emitting diodes (LEDs). The mechanisms by which defects annihilate charge carriers are well understood in materials that emit light at red ...
Electron energy loss spectroscopy (EELS) is a robust technique that characterises the electronic structure and composition of materials by measuring the energy electrons lose when traversing or being ...
Electron Energy Loss Spectroscopy (EELS) measures how much energy electrons lose while interacting with a sample. These findings are then utilized to characterize a broad range of materials. A diagram ...
A new method in electron microscopy enables sub-20-picometer targeting of individual atoms without prior exposure, opening the door to atom-specific analysis and control. (Nanowerk Spotlight) ...
The copper target was operated at voltages of 11 kV, 12 kV, 13 kV, and 14 kV for the electron source, and a 50 kV configuration using a molybdenum target was used as a representative example for the ...
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