DELRAY BEACH, Fla., Jan. 8, 2026 /PRNewswire/ -- According to MarketsandMarkets™, the Machine Vision Camera Market is ...

Lattice Semiconductor announced the latest release of the Lattice sensAI solution stack, delivering expanded model support, ...

Alpha Software (781-229-4500) has introduced manufacturing quality solutions built on its Alpha TransForm no‑code platform to ...

Optical 3D metrology enables fast, non-contact surface roughness measurement of defects and roughness for precise ...

Researchers from Northwestern University, University of Virginia, Carnegie Mellon University, and Argonne National Laboratory have made a significant advancement in defect detection and process ...

Using X-ray beams and machine learning for detecting structural defects, such as pore formation, can help prevent failure of metal 3D-printed parts. Systematic computer-based material design uses ...

A booth demo highlights why the Cognex In-Sight 3800 makes quick work of executing inspection tasks on high-speed manufacturing lines.

Advanced machine learning is beginning to make inroads into yield enhancement methodology as fabs and equipment makers seek to identify defectivity patterns in wafer images with greater accuracy and ...

Researchers have tested eight stand-alone deep learning methods for PV cell fault detection and have found that their accuracy was as high as 73%. All methods were trained and tested on the ELPV ...