Lattice Semiconductor announced the latest release of the Lattice sensAI solution stack, delivering expanded model support, ...
Portable 3D optical inspection with 4Di InSpec transforms surface metrology, enhancing defect detection and quality assurance ...
Optical 3D metrology enables fast, non-contact surface roughness measurement of defects and roughness for precise ...
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Image-based model enhances the detection of surface defects in low-light industrial settings
In industry, the detection of anomalies such as scratches, dents, and discolorations is crucial to ensure product quality and safety. However, conventional methods rely on heavy computational ...
As semiconductor chip technology advances towards nanometre and sub-nanometre scales, the demands becomes exponentially more ...
Defect detection requirements on the order of 10 defective parts per million (DPPM) are driving improvements in inspection tools’ resolution and throughput at foundries and OSATs. However, defects ...
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