What is Electron Backscatter Diffraction (EBSD)? Electron backscatter diffraction (EBSD), also known as backscatter Kikuchi diffraction (BKD), is a powerful characterization technique used to analyze ...
Electron Backscatter Diffraction (EBSD) is an analytical technique that utilises the diffraction of backscattered electrons to characterise the crystallographic orientation, phase, and microstructural ...
In geology, electron backscatter diffraction (EBSD) is a powerful tool for the observation and analysis of microstructures and for phase identification. The EBSD system, by Oxford Instruments, ...
Efficiently identify and map tire fillers with streamlined material analysis—explore the details in this application note.
Identifying hydrogen and hydride phases can be difficult using traditional microanalysis methods. Because of its atomic structure, hydrogen does not release distinctive X-rays when exposed to ...
TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announced that it has developed semi-in-lens versions (i)/(is) which are optimal for the observation of semiconductor devices ...
A scanning electron microscope, acquired in 2016 with a grant from the National Science Foundation, provides a powerful tool for students, faculty, and visiting researchers to study the structure and ...
SBFSEM is an automated technique used to acquire serial images in an SEM for 3D reconstruction, developed by Denk and Horstman 1 and marketed by Gatan as the 3View ® system. The resultant huge ...
The Hitachi S-4700 FE-SEM is a cold field emission high resolution scanning electron microscope. This SEM permits ultra high resolution imaging of thin films and semi-conductor materials on ...
The technique of Cathodoluminescence (CL) is widely employed in electron microscopy. It is routinely applied across various geological studies, including defect states and dating; materials science to ...
TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announces the release of a new Schottky field emission scanning electron microscope, JSM-IT800 in May 2020. Development ...