Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

Researchers in China have developed an electrical imaging technique using three-dimensional (3D) tomographic conductive atomic force microscopy (TC-AFM) to go beyond indirect characterization of ...

Researchers at Oak Ridge National Laboratory have used specialized tools to study materials at the atomic scale and analyze ...

Atomic Force Microscopy (AFM) has evolved into a central technique in nanotechnology, providing three-dimensional imaging and precise measurements at the atomic scale. Its ability to probe surfaces by ...

Cecilia Van Cauwenberghe explains how to measure the future using nanoscale metrology and discusses the global competition ...

Atomic force microscopy (AFM) and infrared (IR) spectroscopy have emerged as complementary techniques that enable the precise characterisation of materials at the nanoscale. AFM provides ...

First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

The Park FX40 Automatic Atomic Force Microscope (AFM) System is capable of high spatial resolution surface mapping and is equipped with a True Non-Contact TM mode capable of nanoscale surface analysis ...

The NANOscientific Symposium Series (NSS) 2025 has successfully concluded its global program, bringing together the ...

Explore the latest advancements in nanotechnology with this curated eBook on Atomic Force Microscopy (AFM). This essential collection highlights innovative applications of AFM across materials ...

A new technical paper titled “Probing the Nanoscale Onset of Plasticity in Electroplated Copper for Hybrid Bonding Structures via Multimodal Atomic Force Microscopy” was published by researchers at ...