Atomic force microscopy has the capacity to identify a range of nanoscale properties alongside topography in any environment; this is central to the power and extensive applicability of this method.
Schematic illustration of Friction Force Microscopy (FFM). The AFM cantilever, a small diving board-like structure about 200 micrometers long, 50 micrometers wide, and 1 micrometer thick, has a sharp ...
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