In this interview, Professor Emeritus Mervyn Miles at the University of Bristol speaks about the history and technology behind Atomic Force Microscopy (AFM) and Scanning Probe Microscopy (SPM). Can ...

A research team in Japan has successfully identified the atoms and common defects existing at the most stable surface of the anatase form of titanium dioxide by characterizing this material at the ...

Atomic force microscopy (AFM) is a method of topographical measurement, wherein a fine probe is raster scanned over a material, and the minute variation in probe height is interpreted by laser ...

STM/AFM: A BROADENING ARRAY OF APPLICATIONS The scanning tunneling microscope (STM) was developed by physicists Gerd Binnig and Heinrich Rohrer in 1982 to investigate the surfaces of solids, such as ...

Christoph Gerber, who co-invented the atomic force microscope, tells Matthew Chalmers how the AFM came about 30 years ago and why it continues to shape research at the nanoscale Nano-vision Christoph ...

Atomic force microscopy (AFM) is used widely to study surfaces with a resolution on the nanometer scale – vastly inferior to atomic resolution offered by scanning tunneling microscopy (STM). In 1982, ...

The design of the 1TS-200MW active vibration isolation workstation has been optimized to achieve best possible isolation for delicate instruments such as the UHV-Scanning Probe Microscopes (AFM, STM), ...

Topgraphy and frequency shift images of the ITP radical in constant-current mode. Courtesy : D Ebeling Ten years ago, researchers succeeded in significantly increasing the lateral resolution of low ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The SmartSPM Scanning Probe Microscope ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Request A Quote Download PDF Copy Request A Quote Download ...